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Failure Prediction of IC Interconnect Structures Using Cohesive Zone Modelling
Fracture of Nano and Engineering Materials and Structures
Springer Netherlands, January 2006
B. A. E. van Hal, R. H. J. Peerlings, M. G. D. Geers, G. Q. Zhang
E. E. Gdoutos
The data shown below were compiled from readership statistics for 4 Mendeley readers of this research output. Click here to see the associated Mendeley record.
|Readers by professional status||Count||As %|
|Student > Ph. D. Student||1||25%|
|Readers by discipline||Count||As %|