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| Chapter title |
Scratching and Brittle Fracture of Semiconductor In-Situ Scanning Electron Microscope
|
|---|---|
| Chapter number | 56 |
| Book title |
Fracture of Nano and Engineering Materials and Structures
|
| Published by |
Springer Netherlands, January 2006
|
| DOI | 10.1007/1-4020-4972-2_56 |
| Book ISBNs |
978-1-4020-4971-2, 978-1-4020-4972-9
|
| Authors |
K. Wasmer, C. Pouvreau, J. Giovanola, J. Michler |
| Editors |
E. E. Gdoutos |
Mendeley readers
The data shown below were compiled from readership statistics for 16 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Germany | 1 | 6% |
| Switzerland | 1 | 6% |
| Unknown | 14 | 88% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Researcher | 6 | 38% |
| Student > Doctoral Student | 3 | 19% |
| Student > Ph. D. Student | 3 | 19% |
| Other | 1 | 6% |
| Student > Master | 1 | 6% |
| Other | 1 | 6% |
| Unknown | 1 | 6% |
| Readers by discipline | Count | As % |
|---|---|---|
| Materials Science | 7 | 44% |
| Physics and Astronomy | 5 | 31% |
| Chemistry | 1 | 6% |
| Engineering | 1 | 6% |
| Unknown | 2 | 13% |