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Chapter title |
Scratching and Brittle Fracture of Semiconductor In-Situ Scanning Electron Microscope
|
---|---|
Chapter number | 56 |
Book title |
Fracture of Nano and Engineering Materials and Structures
|
Published by |
Springer Netherlands, January 2006
|
DOI | 10.1007/1-4020-4972-2_56 |
Book ISBNs |
978-1-4020-4971-2, 978-1-4020-4972-9
|
Authors |
K. Wasmer, C. Pouvreau, J. Giovanola, J. Michler |
Editors |
E. E. Gdoutos |
Mendeley readers
The data shown below were compiled from readership statistics for 16 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Germany | 1 | 6% |
Switzerland | 1 | 6% |
Unknown | 14 | 88% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Researcher | 6 | 38% |
Student > Doctoral Student | 3 | 19% |
Student > Ph. D. Student | 3 | 19% |
Other | 1 | 6% |
Student > Master | 1 | 6% |
Other | 1 | 6% |
Unknown | 1 | 6% |
Readers by discipline | Count | As % |
---|---|---|
Materials Science | 7 | 44% |
Physics and Astronomy | 5 | 31% |
Chemistry | 1 | 6% |
Engineering | 1 | 6% |
Unknown | 2 | 13% |