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Extreme Statistics in Nanoscale Memory Design

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Cover of 'Extreme Statistics in Nanoscale Memory Design'

Table of Contents

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    Book Overview
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    Chapter 1 Introduction
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    Chapter 2 Extreme Statistics in Memories
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    Chapter 3 Statistical Nano CMOS Variability and Its Impact on SRAM
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    Chapter 4 Importance Sampling-Based Estimation: Applications to Memory Design
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    Chapter 5 Direct SRAM Operation Margin Computation with Random Skews of Device Characteristics
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    Chapter 6 Yield Estimation by Computing Probabilistic Hypervolumes
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    Chapter 7 Most Probable Point-Based Methods
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    Chapter 8 Extreme Value Theory: Application to Memory Statistics
Attention for Chapter 5: Direct SRAM Operation Margin Computation with Random Skews of Device Characteristics
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