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Extreme Statistics in Nanoscale Memory Design

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Overall attention for this book and its chapters
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18 Mendeley
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Title
Extreme Statistics in Nanoscale Memory Design
Published by
Springer US, September 2010
DOI 10.1007/978-1-4419-6606-3
ISBNs
978-1-4419-6605-6, 978-1-4419-6606-3
Editors

Singhee, Amith, Rutenbar, Rob A.

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 18 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
United Kingdom 1 6%
United States 1 6%
Unknown 16 89%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 8 44%
Student > Master 4 22%
Researcher 3 17%
Professor 1 6%
Student > Bachelor 1 6%
Other 1 6%
Readers by discipline Count As %
Engineering 13 72%
Computer Science 2 11%
Mathematics 1 6%
Design 1 6%
Unknown 1 6%