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Extreme Statistics in Nanoscale Memory Design

Overview of attention for book
Attention for Chapter 5: Direct SRAM Operation Margin Computation with Random Skews of Device Characteristics
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Chapter title
Direct SRAM Operation Margin Computation with Random Skews of Device Characteristics
Chapter number 5
Book title
Extreme Statistics in Nanoscale Memory Design
Published by
Springer, Boston, MA, January 2010
DOI 10.1007/978-1-4419-6606-3_5
Book ISBNs
978-1-4419-6605-6, 978-1-4419-6606-3
Authors

Robert C. Wong

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 1 Mendeley reader of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 1 100%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 1 100%
Readers by discipline Count As %
Mathematics 1 100%