↓ Skip to main content

Extreme Statistics in Nanoscale Memory Design

Overview of attention for book
Attention for Chapter 6: Yield Estimation by Computing Probabilistic Hypervolumes
Altmetric Badge

Citations

dimensions_citation
16 Dimensions

Readers on

mendeley
3 Mendeley
You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output. Click here to find out more.
Chapter title
Yield Estimation by Computing Probabilistic Hypervolumes
Chapter number 6
Book title
Extreme Statistics in Nanoscale Memory Design
Published by
Springer, Boston, MA, January 2010
DOI 10.1007/978-1-4419-6606-3_6
Book ISBNs
978-1-4419-6605-6, 978-1-4419-6606-3
Authors

Chenjie Gu, Jaijeet Roychowdhury

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 3 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 3 100%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 2 67%
Student > Master 1 33%
Readers by discipline Count As %
Mathematics 1 33%
Computer Science 1 33%
Engineering 1 33%