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Power-constrained Testing of VLSI Circuits

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5 Mendeley
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Title
Power-constrained Testing of VLSI Circuits
Published by
Springer US, April 2006
DOI 10.1007/b105922
ISBNs
978-1-4020-7235-2, 978-0-306-48731-6
Authors

Nicolici, Nicola, Al-Hashimi, Bashir M.

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 5 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 5 100%

Demographic breakdown

Readers by professional status Count As %
Researcher 2 40%
Student > Ph. D. Student 1 20%
Student > Postgraduate 1 20%
Unknown 1 20%
Readers by discipline Count As %
Engineering 3 60%
Design 1 20%
Unknown 1 20%