Power-constrained Testing of VLSI Circuits
Springer US
Chapter title |
Test Power Minimization Using Multiple Scan Chains
|
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Chapter number | 5 |
Book title |
Power-constrained Testing of VLSI Circuits
|
Published by |
Springer, Boston, MA, January 2004
|
DOI | 10.1007/0-306-48731-4_5 |
Book ISBNs |
978-1-4020-7235-2, 978-0-306-48731-6
|