Power-constrained Testing of VLSI Circuits
Springer US
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Timeline
| Chapter title |
Power Minimization Based on Best Primary Input Change Time
|
|---|---|
| Chapter number | 4 |
| Book title |
Power-constrained Testing of VLSI Circuits
|
| Published by |
Springer, Boston, MA, January 2004
|
| DOI | 10.1007/0-306-48731-4_4 |
| Book ISBNs |
978-1-4020-7235-2, 978-0-306-48731-6
|