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Chapter title |
On the Use of the GeLα Line in Thin Film X-Ray Microanalysis of Si 1- x Ge x /Si Heterostructures
|
---|---|
Chapter number | 15 |
Book title |
Microbeam and Nanobeam Analysis
|
Published by |
Springer, Vienna, January 1996
|
DOI | 10.1007/978-3-7091-6555-3_15 |
Book ISBNs |
978-3-21-182874-8, 978-3-70-916555-3
|
Authors |
Aldo Armigliato, Thomas Lewis, Rodolfo Rosa, Armigliato, Aldo, Lewis, Thomas, Rosa, Rodolfo |