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Microbeam and Nanobeam Analysis

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Table of Contents

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    Book Overview
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    Chapter 1 Monte Carlo Simulation Techniques for Quantitative X-Ray Microanalysis
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    Chapter 2 Transport Equation Approach to Electron Microbeam Analysis: Fundamentals and Applications
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    Chapter 3 Use of Soft X-Rays in Microanalysis
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    Chapter 4 Intensity Measurement of Wavelength Dispersive X-Ray Emission Bands: Applications to the Soft X-Ray Region
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    Chapter 5 Synchrotron Radiation Induced X-Ray Microfluorescence Analysis
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    Chapter 6 Particle-Induced X-Ray Emission — A Quantitative Technique Suitable for Microanalysis
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    Chapter 7 Cathodoluminescence Microscopy and Spectroscopy of Semiconductors and Wide Bandgap Insulating Materials
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    Chapter 8 Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
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    Chapter 9 Three-Dimensional Nanoanalysis with the Tomographic Atom-Probe
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    Chapter 10 Microanalysis at Atomic Resolution
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    Chapter 11 Composition of Vanadium Carbides Formed by Solidification in Fe-V-C-M Alloys: Influence of Additions (M = Al, Cu, Mo)
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    Chapter 12 Electron Transmission Coefficient for Oblique Angle of Incidence
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    Chapter 13 Depth Distribution Function for Oblique Angle of Incidence
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    Chapter 14 Simulation of EDS Spectra Using X-RES Software
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    Chapter 15 On the Use of the GeLα Line in Thin Film X-Ray Microanalysis of Si 1- x Ge x /Si Heterostructures
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    Chapter 16 Computer Simulations of the X-Ray Intensity Distribution from Submicron Particles Embedded in a Matrix
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    Chapter 17 Determination of Rare Earth Elements in Biological and Mineral Apatite by EPMA and LAMP-ICP-MS
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    Chapter 18 Quantitative Analysis of the Compound Layer of Plasma Nitrided Pure Iron
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    Chapter 19 Correction of the Edge Effect in Auger Electron Microscopy
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    Chapter 20 Low Energy Imaging of Nonconductive Surfaces in SEM
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    Chapter 21 Investigation of the Bonding Mechanism of Glass Ceramic Layers on Metal Alloys
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    Chapter 22 Monte Carlo Method for Quantitative Analysis of Bulk and Layered Samples
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    Chapter 23 SIMS Linescan Profiling of Chemically Bevelled Semiconductors: A Method of Overcoming Ion Beam Induced Segregation in Depth Profiling
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    Chapter 24 Experimental Verification of Theoretical Models Simulating the Temperature Increase in EPMA of Glass
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    Chapter 25 Quantitation of Mineral Elements of Different Fruit Pollen Grains
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    Chapter 26 Electron Beam Induced Migration of Alkaline Ions in Silica Glass
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    Chapter 27 Application of the Boltzmann Transport Equation in the Thickness Determination of Thin Films
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    Chapter 28 Characterisation of the Shape of Microparticles via Fractal and Fourier Analyses of Scanning Electron Microscope Images
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    Chapter 29 Calculation of the Surface Ionisation Using Analytical Models of Electron Backscattering
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    Chapter 30 Thickness Determination of Thin Insulating Layers
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    Chapter 31 High Energy and Angular Resolution Dynamic Secondary Ion Mass Spectrometry
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    Chapter 32 EPMA and Mass Spectrometry of Soil and Grass Containing Radioactivity from the Nuclear Accident at Chernobyl
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    Chapter 33 Application of a New Monte Carlo Simulation Algorithm to Electron Probe Microanalysis
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    Chapter 34 Topography Development on Single Crystal MgO Under Ion Beam Bombardment
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    Chapter 35 Determination of SPM TIP Shape Using Polystyrene Latex Balls
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    Chapter 36 Combined Characterization of Nanostructures by AEM and STM
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    Chapter 37 Study of Quasi-Fractal Many-Particle-Systems and Percolation Networks by Zero-Loss Spectroscopic Imaging, Electron Energy-Loss Spectroscopy and Digital Image Analysis
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    Chapter 38 Calculation of Bremsstrahlung Spectra for Multilayer Samples
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    Chapter 39 Thickness Measurement of Thin Films by EPMA — Influence of ø(0), MAC’s and Substrate
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    Chapter 40 A Simple Procedure to Check the Spectral Response of an EDX Detector
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    Chapter 41 Virtual WDS
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    Chapter 42 Monte Carlo Simulation Program with a Free Configuration of Specimen and Detector Geometries
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    Chapter 43 Barriers to Energy Dispersive Spectrometry with Low Energy X-Rays
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    Chapter 44 Measurements of Ga 1-x Al x As Layers on GaAs with EDS
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    Chapter 45 The Relative Intensity Factor for Lα Radiation Considering the Different Mass Absorption of Lα and Lβ Radiation
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    Chapter 46 Determination of the Solubility of Cerium in BaTiO 3 by Quantitative WDS Electron Probe Microanalysis
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    Chapter 47 Simulation of X-Ray Diffraction Profiles of Gradually Relaxed Epilayers
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    Chapter 48 Monte Carlo Simulation of Electron Scattering for Arbitrary 2D Structures Using a Modified Quadtree Geometry Discretization
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    Chapter 49 Chemical-Bond Characterization of Nanostructures by EELS
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    Chapter 50 Local Determination of Carbon by Combining Beta-Autoradiography and Electron Microprobe Analysis
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    Chapter 51 The Check of the Elastic Scattering Model in Monte-Carlo Simulation
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    Chapter 52 True Colour X-Ray Vision for Electron Microscopy and Microanalysis
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    Chapter 53 Determination of the Oxidation States of Nb by Auger Electron Spectroscopy
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    Chapter 54 Study by SIMS of the 54 Cr and 18 O Diffusion in Cr 2 O 3 and in Cr 2 O 3 Scales
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    Chapter 55 Comparison of Back-Foil Scanning X-Ray Microfluorescence and Electron Probe X-Ray Microanalysis for the Elemental Characterisation of Thin Coatings
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    Chapter 56 Electron Probe X-Ray Microanalysis of Coatings
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    Chapter 57 Analysis of Layers: X-Ray Maps of Change in Thickness Obtained by Electron Macroprobe
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    Chapter 58 Comparison of Simulated and Experimental Auger Intensities of Au, Pt, Ni and Si in Absolute Units
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    Chapter 59 Practical Aspects and Applications of EPMA at Low Electron Energies
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    Chapter 60 Oxidation and Reduction Processes of Be/BeO Induced by Electrons
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Title
Microbeam and Nanobeam Analysis
Published by
Springer Vienna, December 2012
DOI 10.1007/978-3-7091-6555-3
ISBNs
978-3-21-182874-8, 978-3-70-916555-3
Editors

Benoit, Daniele, Bresse, Jean-Francois, Van’t dack, Luc, Werner, Helmut, Wernisch, Johann

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 6 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 6 100%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 3 50%
Professor 1 17%
Researcher 1 17%
Unknown 1 17%
Readers by discipline Count As %
Environmental Science 1 17%
Earth and Planetary Sciences 1 17%
Physics and Astronomy 1 17%
Chemistry 1 17%
Unknown 2 33%