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Chapter title |
Comparison of Back-Foil Scanning X-Ray Microfluorescence and Electron Probe X-Ray Microanalysis for the Elemental Characterisation of Thin Coatings
|
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Chapter number | 55 |
Book title |
Microbeam and Nanobeam Analysis
|
Published by |
Springer, Vienna, January 1996
|
DOI | 10.1007/978-3-7091-6555-3_55 |
Book ISBNs |
978-3-21-182874-8, 978-3-70-916555-3
|
Authors |
Evangelos Valamontes, Androula G. Nassiopoulos, Valamontes, Evangelos, Nassiopoulos, Androula G. |