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Mendeley readers
Chapter title |
SIMS Linescan Profiling of Chemically Bevelled Semiconductors: A Method of Overcoming Ion Beam Induced Segregation in Depth Profiling
|
---|---|
Chapter number | 23 |
Book title |
Microbeam and Nanobeam Analysis
|
Published by |
Springer, Vienna, January 1996
|
DOI | 10.1007/978-3-7091-6555-3_23 |
Book ISBNs |
978-3-21-182874-8, 978-3-70-916555-3
|
Authors |
Ching-Ming Hsu, David S. McPhail, Hsu, Ching-Ming, McPhail, David S. |
Mendeley readers
The data shown below were compiled from readership statistics for 1 Mendeley reader of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 1 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Unspecified | 1 | 100% |
Readers by discipline | Count | As % |
---|---|---|
Unspecified | 1 | 100% |