You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output.
Click here to find out more.
Mendeley readers
Chapter title |
In Situ Detection of Flaws in Multilayer Ceramic Capacitors Using Electronic Speckle Pattern Interferometry
|
---|---|
Chapter number | 56 |
Book title |
Nondestructive Characterization of Materials VI
|
Published by |
Springer, Boston, MA, January 1994
|
DOI | 10.1007/978-1-4615-2574-5_56 |
Book ISBNs |
978-1-4613-6100-8, 978-1-4615-2574-5
|
Authors |
Y. C. Chan, F. Yeung, G. C. Jin, N. K. Bao, P. S. Chung, Chan, Y. C., Yeung, F., Jin, G. C., Bao, N. K., Chung, P. S. |
Mendeley readers
The data shown below were compiled from readership statistics for 2 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 2 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Professor | 1 | 50% |
Other | 1 | 50% |
Readers by discipline | Count | As % |
---|---|---|
Materials Science | 2 | 100% |