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Chapter title |
Scanning Tunneling Microscopy Studies of Electromigration on Si(100) Surfaces under External Strain
|
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Chapter number | 97 |
Book title |
Nondestructive Characterization of Materials VI
|
Published by |
Springer, Boston, MA, January 1994
|
DOI | 10.1007/978-1-4615-2574-5_97 |
Book ISBNs |
978-1-4613-6100-8, 978-1-4615-2574-5
|
Authors |
Yi Wei, W. E. Packard, John D. Dow, I. S. T. Tsong, Wei, Yi, Packard, W. E., Dow, John D., Tsong, I. S. T. |