EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany : Volume 1…
Springer-Verlag Berlin Heidelberg
Chapter title |
Applications of aberration-corrected TEM-STEM and high-resolution EELS for the study of functional materials
|
---|---|
Chapter number | 7 |
Book title |
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
|
Published by |
Springer, Berlin, Heidelberg, January 2008
|
DOI | 10.1007/978-3-540-85156-1_7 |
Book ISBNs |
978-3-54-085154-7, 978-3-54-085156-1
|
Authors |
G. A. Botton, C. Maunders, L. Gunawan, K. Cui, L. Y. Chang, S. Lazar |
Country | Count | As % |
---|---|---|
Unknown | 1 | 100% |
Readers by professional status | Count | As % |
---|---|---|
Student > Master | 1 | 100% |
Readers by discipline | Count | As % |
---|---|---|
Materials Science | 1 | 100% |