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Chapter title |
Off-axis electron holography of FIB-prepared semiconductor specimens with mV sensitivity
|
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Chapter number | 125 |
Book title |
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
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Published by |
Springer, Berlin, Heidelberg, January 2008
|
DOI | 10.1007/978-3-540-85156-1_125 |
Book ISBNs |
978-3-54-085154-7, 978-3-54-085156-1
|
Authors |
D. Cooper, R. Truche, P. Rivallin, J. Hartmann, F. Laugier, F. Bertin, A. Chabli |