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EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany : Volume 1: Instrumentation and Methods

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Table of Contents

  1. Altmetric Badge
    Book Overview
  2. Altmetric Badge
    Chapter 1 Aberration corrected STEM and EELS: Atomic scale chemical mapping
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    Chapter 2 An update on the TEAM project — first results from the TEAM 0.5 microscope, and its future development
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    Chapter 3 Synchrotron based X-ray Microscopy: state of the art and applications
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    Chapter 4 High-resolution spectro-microscopy with low-voltage electrons and double aberration correction
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    Chapter 5 Developments of aberration correction systems for current and future requirements
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    Chapter 6 STEM Aberration Correction: an Integrated Approach
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    Chapter 7 Applications of aberration-corrected TEM-STEM and high-resolution EELS for the study of functional materials
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    Chapter 8 Aberration corrected TEM and STEM for dynamic in situ experiments
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    Chapter 9 HREM study of the SrTiO3 Σ3 (112) grain boundary
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    Chapter 10 A Method to Measure Source Size in Aberration Corrected Electron Microscopes
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    Chapter 11 Determining resolution in the transmission electron microscope: object-defined resolution below 0.5Å
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    Chapter 12 Direct measurement of aberrations by convergent-beam electron holography (CHEF)
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    Chapter 13 Atomic Structure of BiFeO3-BiCrO3 film on (111) SrTiO3 Grown by Dual Cross Beam Pulsed Laser Deposition
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    Chapter 14 Demonstration of CC/CS-correction in HRTEM
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    Chapter 15 New electron diffraction technique using Cs-corrected annular LACDIF: comparison with electron precession
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    Chapter 16 The newly installed aberration corrected dedicated STEM (Hitachi HD2700C) at Brookhaven National Laboratory
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    Chapter 17 Uranium single atom imaging and EELS mapping using aberration corrected STEM and LN2 cold stage
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    Chapter 18 Sub-Ångstrøm Low-Voltage Electron Microscopy — future reality for deciphering the structure of beam-sensitive nanoobjects?
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    Chapter 19 Detecting and resolving individual adatoms, vacancies, and their dynamics on graphene membranes
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    Chapter 20 Scanning confocal electron microscopy in a double aberration corrected transmission electron microscope
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    Chapter 21 Design of apochromatic TEM composed of usual round lenses
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    Chapter 22 Back-Scattered Electron microscopy in Aberration corrected Electron microscope
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    Chapter 23 Structure determination of H-encapsulating clathrate compounds in aberration-corrected STEM
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    Chapter 24 Performance of R005 Microscope and Aberration Correction System
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    Chapter 25 Optimum operation of Schottky electron sources: brightness, energy spread and stability
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    Chapter 26 The MANDOLINE filter and its performance
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    Chapter 27 Using a monochromator to improve the resolution in focal-series reconstructed TEM down to 0.5Å
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    Chapter 28 First performance measurements and application results of a new high brightness Schottky field emitter for HR-S/TEM at 80-300kV acceleration voltage
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    Chapter 29 Image Information transfer through a post-column energy filter detected by a lens-coupled CCD camera
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    Chapter 30 Third-rank computation of electron and ion optical systems with several and rotated Wien filters
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    Chapter 31 Wavelength dispersive soft X-ray emission spectroscopy attached to TEM using multi-capirary X-ray lens
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    Chapter 32 Miniature electrostatic-magnetostatic column for electrons
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    Chapter 33 EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
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    Chapter 34 A hybrid electron energy loss spectrometer with simultaneous serial and parallel detection
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    Chapter 35 In-focus phase contrast: Present state and future developments
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    Chapter 36 The Detective Quantum Efficiency of Electron Area Detectors
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    Chapter 37 Experimental observation of the improvement in MTF from backthinning a CMOS direct electron detector
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    Chapter 38 High speed simultaneous X-ray and electron imaging and spectroscopy at synchrotrons and TEMs
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    Chapter 39 The image intensity in Zernike mode with electrons
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    Chapter 40 Application of a Hilbert phase plate in transmission electron microscopy of materials science samples
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    Chapter 41 Optimal Imaging Parameters in Cs-Corrected Transmission Electron Microscopy with a Physical Phase Plate
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    Chapter 42 Electron optical design of the Phase Aberration Corrected Electron Microscope
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    Chapter 43 Direct electron detectors for TEM
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    Chapter 44 A Newly Developed 64 MegaPixel camera for Transmission Electron Microscopy
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    Chapter 45 Characterization of a fiber-optically coupled 8k CCD/CMOS device
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    Chapter 46 Direct Single-Electron Imaging using a pnCCD Detector
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    Chapter 47 Quantitative TEM and STEM Simulations
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    Chapter 48 Quantitative determination of the chemical composition of an alloy by High Angle Annular Dark Field imaging
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    Chapter 49 The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data
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    Chapter 50 First time quantification of the HRTEM information-limit reveals insufficiency of the Young’s-fringe test
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    Chapter 51 Quantitative Investigations of the Depth of Field in a Corrected High Resolution Transmission Electron Microscope
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    Chapter 52 Quantitative characterisation of surfaces on bi-metallic Pt nanoparticles using combined exit wave restoration and aberration-corrected TEM
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    Chapter 53 An HAADF investigation of AlAs-GaAs interfaces using SuperSTEM
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    Chapter 54 Spatial Coherence and the Quantitative Interpretation of Atomic Resolution Images
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    Chapter 55 Analysis of HRTEM diffractograms from amorphous materials: a simple and minor (but not explained so far?) question revisited
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    Chapter 56 HAADF-STEM image simulation of large scale nanostructures
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    Chapter 57 Aberration-corrected HRTEM study of incommensurate misfit layer compound interfaces
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    Chapter 58 Influence of atomic displacements due to elastic strain in HAADF-STEM simulated images
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    Chapter 59 Effects of electron channeling in HAADF intensity
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    Chapter 60 Analysis of the mechanism of N incorporation in N-doped GaAs quantum wells
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    Chapter 61 Coherence of high-angle scattered phonon loss electrons and their relevance to TEM and STEM ADF Stobbs Factors
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    Chapter 62 Strain measurements in electronic devices by aberration-corrected HRTEM and dark-field holography
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    Chapter 63 PPA: An Improved Implementation of Peak Pairs procedure as a DM plug-in for Strain Mapping
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    Chapter 64 Domain structure in Delithiated LiFePO4, a cathode material for Li ion Battery Applications
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    Chapter 65 New Approach to Quantitative ADF STEM
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    Chapter 66 Reconstruction of the projected crystal potential in high-resolution transmission electron microscopy
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    Chapter 67 Three-dimensional atomic-scale structure of size-selected nanoclusters on surfaces
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    Chapter 68 Direct retrieval of a complex wave from its diffraction pattern
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    Chapter 69 HRTEM evaluation of iron in acid treated ground vermiculite from Santa Olalla (Huelva, Spain)
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    Chapter 70 Bloch wave analysis of depth dependent strain effects in high resolution electron microscopy
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    Chapter 71 Quantitative local strain analysis of Si/SiGe heterostructures using HRTEM
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    Chapter 72 Displacement field analysis around hydrogen implantation induced platelets (HIPs) in semi-conductors
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    Chapter 73 Thickness effects in Tilted Sample Annular Dark Field Scanning Transmission Electron Microscopy
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    Chapter 74 A novel emission potential multislice method to calculate intensity contributions for thermal diffuse scattering in plane wave illumination TEM
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    Chapter 75 Three-dimensional HREM Structure Retrieval
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    Chapter 76 Description of electron microscope image details based on structure relaxations with enhanced interaction potentials
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    Chapter 77 Computation and parametrization of Debye-Waller temperature factors for sphalerite type II-VI, III-V and group IV semiconductors
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    Chapter 78 Structural Investigation of Amorphous/Crystalline Interfaces by Iterative Digital Image Series Matching
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    Chapter 79 Novel carbon nanosheets as support foils for ultrahigh resolution TEM studies of nanoobjects
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    Chapter 80 Quantitative HRTEM studies of reconstructed exit-plane waves retrieved from C S-corrected electron microscopes
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    Chapter 81 Geometrical phase analysis of the 1:1 cation ordered domains in complex perovskite ferroelectrics
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    Chapter 82 The Stobbs factor in HRTEM: Hunt for a phantom?
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    Chapter 83 EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
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    Chapter 84 Argand plot: a sensitive fingerprint for electron channelling
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    Chapter 85 Atomic-resolution studies of In2O3-ZnO compounds on aberration-corrected electron microscopes
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    Chapter 86 Advances in automated diffraction tomography
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    Chapter 87 Identification/ fingerprinting of nanocrystals by precession electron diffraction
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    Chapter 88 On the Origin and Asymmetry of High Order Laue Zone Lines Splitting in Convergent Beam Electron Diffraction
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    Chapter 89 Precession electron diffraction: application to organic crystals and hybrid inorganic-organic materials
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    Chapter 90 Structural studies of amorphous materials using RDF, RMC and DFT refinement
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    Chapter 91 A Nanoprobe Electron Diffraction Study of Surface Phases in LiCoO2
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    Chapter 92 Structural features of RF magnetron sputter deposited Al-Fe and Al-Cu thin films
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    Chapter 93 Structural Investigation of a Layered Carbon Nitride Polymer by Electron Diffraction
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    Chapter 94 Measuring the particle density of a nanocrystal deposit using DF images and a reciprocal space analysis
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    Chapter 95 Towards a quantitative understanding of precession electron diffraction
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    Chapter 96 Electron crystallography by quantitative CHEF
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    Chapter 97 Precession Electron Diffraction for the characterization of twinning in pseudo-symmetrical crystals: case of coesite
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    Chapter 98 Electron precession characterization of pseudo-merohedral twins in the LaGaO3 perovskite
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    Chapter 99 Kikuchi electron double diffraction
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    Chapter 100 The structure of the complex oxide PbMnO2.75 solved by precession electron diffraction
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    Chapter 101 Software Precession Electron Diffraction
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    Chapter 102 A new method for electron diffraction based analysis of phase fractions and texture in thin films of metallic nano-crystals
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    Chapter 103 Local structures of metallic glasses studied by experimental RDF and model refinement
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    Chapter 104 Three groups of hexagonal phases and their relation to the i-phase in Zn-Mg-RE alloy
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    Chapter 105 Diffraction analysis of incommensurate modulation in “chain-ladder” composite crystal (Sr/Ca)14Cu24O41
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    Chapter 106 Contribution of electron precession to the study of crystals displaying small symmetry departures
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    Chapter 107 The symmetry of microdiffraction electron precession patterns
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    Chapter 108 Measurement of GaAs structure factors from the diffraction of parallel and convergent electron nanoprobes
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    Chapter 109 Differential Electron Diffraction
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    Chapter 110 Atomic Structure Determination by “Observing” Structural Phase in 3-Beam CBED Patterns
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    Chapter 111 Automatic space group determination using precession electron diffraction patterns
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    Chapter 112 Compositional dependence of the (200) electron diffraction in dilute III–V semiconductor solid solutions
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    Chapter 113 Investigation of the local crystal lattice parameters in SiGe nanostructures by convergent-beam electron diffraction analysis
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    Chapter 114 Computer simulation of electron nanodiffraction from polycrystalline materials
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    Chapter 115 An analytical approach of the HOLZ lines splitting on relaxed samples
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    Chapter 116 ELDISCA C# — a new version of the program for identifying electron diffraction patterns
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    Chapter 117 Mixing Real and Reciprocal Space
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    Chapter 118 Structure solution of intermediate tin oxide, SnO2−x, by electron precession
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    Chapter 119 “Phase-scrambling” multislice simulations of precession electron diffraction
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    Chapter 120 High-Resolution Electron Holography on Ferroelectrics
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    Chapter 121 Imaging parameters for optimized noise properties in high-resolution off-axis holograms in a Cs-corrected TEM
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    Chapter 122 Partial coherence in inelastic holography
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    Chapter 123 FIB prepared and Tripod polished prepared p-n junction specimens examined by off-axis electron holography
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    Chapter 124 Modelling kink vortices in high-T c superconductors
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    Chapter 125 Off-axis electron holography of FIB-prepared semiconductor specimens with mV sensitivity
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    Chapter 126 Off-axis electron holography and the FIB, a systematic study of the artefacts observed in semiconductor specimens
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    Chapter 127 Analytical TEM and electron holography of magnetic field distribution in nanocrystalline Co layers deposited on Cu
  129. Altmetric Badge
    Chapter 128 Electron Holography with Cs-corrected Tecnai F20 — elimination of the incoherent damping introduced by the biprism in conventional electron microscopes
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    Chapter 129 Can the discontinuity in the polarity of the oxide layers at the interface SrTiO3-LaAlO3 be resolved by using Electron Holography with Cs-corrected TEM?
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    Chapter 130 Energy-filtered DBI/H
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    Chapter 131 Strain determination by dark-field electron holography
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    Chapter 132 Nonlinear Electron Inline Holography
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    Chapter 133 Electron Holography: Performance and performance limits
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    Chapter 134 Reconstruction methods for in-line electron holography of nanoparticles
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    Chapter 135 Electron holography of soot nanoparticles
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    Chapter 136 Holographic tomography of electrostatic potentials in semiconductor devices
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    Chapter 137 Electron Holography on the charge modulated structure In2O3(ZnO)m in comparison with DFT-calculations
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    Chapter 138 Correction of the object wave using iteratively reconstructed local object tilt and thickness
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    Chapter 139 Extended field of view for medium resolution electron holography at Philips CM 200 Microscope
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    Chapter 140 Electron holography of biological and organic objects
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    Chapter 141 Magnetic configurations of isolated and assemblies of iron 30 nm nanocubes studied by electron holography
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    Chapter 142 Electron holography study of ferroelectric solid solutions
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    Chapter 143 Digital holographic interference microscopy of phase microscopic objects investigation
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    Chapter 144 Reconstruction of 3D (Ge,Si) islands by 2D phase mapping
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    Chapter 145 Quantitative electron tomography of biological structures using elastic and inelastic scattering
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    Chapter 146 Discrete tomography in materials science: less is more?
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    Chapter 147 Towards atomic-scale bright-field electron tomography for the study of fullerene-like nanostructures
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    Chapter 148 DART explained: how to carry out a discrete tomography reconstruction
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    Chapter 149 Optical depth sectioning of metallic nanoparticles in the aberration-corrected scanning transmission electron microscope
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    Chapter 150 3D-Geometrical and chemical quantification of Au@SiOx nano-composites in HAADF-STEM imaging mode
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    Chapter 151 Electron tomography of mesostructured cellular foam silica
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    Chapter 152 A Study of Stacked Si Nanowire Devices by Electron Tomography
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    Chapter 153 Simulation of the electron radiation damage in an amorphous Ge sample
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    Chapter 154 Observation of Three-dimensional Elemental Distribution by using EF-TEM Tomography
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    Chapter 155 HAADF-TEM Tomography of the precipitation state in an Al-Zn-Mg alloy
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    Chapter 156 STEM electron tomography of gold nanostructures
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    Chapter 157 Three-dimensional imaging of semiconductor nanostructures by compositional-sensitive diffraction contrast electron tomography studies
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    Chapter 158 A full tilt range goniometer inside a TEM goniometer
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    Chapter 159 Four-dimensional STEM-EELS Tomography
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    Chapter 160 Embedment-free section electron microscopy (EM): a highly potential advantage in application to EM tomography
  162. Altmetric Badge
    Chapter 161 Quantification and Segmentation of Electron Tomography Data- Exemplified at ErSi2 Nanocrystals in SiC
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    Chapter 162 3-D TEM observation of xenon nano-precipitates in aluminium crystals
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    Chapter 163 Dark-field TEM tomography of ordered domain morphology in a Ni4Mo alloy
  165. Altmetric Badge
    Chapter 164 Optimum optical condition of Tomography for thick samples
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    Chapter 165 3-dimensional nanoparticle analysis using electron tomography
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    Chapter 166 Electron Tomography of ZnO Nanocones with Secondary Signals in TEM
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    Chapter 167 Quantification of Nanoparticle Tomograms
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    Chapter 168 Tomographic imaging ultra-thick specimens with nanometer resolution
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    Chapter 169 Three-dimensional imaging at the mesoscopic scale using STEM-in-SEM
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    Chapter 170 Three-dimensional potential mapping of nanostructures with electron-holographic tomography
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    Chapter 171 Design of high-speed tomography with the 3MV ultrahigh voltage electron microscope
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    Chapter 172 The point spread function assessment of MeV electron imaging quality for thick specimens
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    Chapter 173 Relevance of the minimum projection number to specimen structures for high-quality electron tomography
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    Chapter 174 Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy
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    Chapter 175 EMCD with nm Resolution and Below: Experiments, Proposals, and a Paradox
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    Chapter 176 Combining electronic and optical spectroscopy at the nanometer scale in a STEM
  178. Altmetric Badge
    Chapter 177 Deconvolution of core loss electron energy loss spectra
  179. Altmetric Badge
    Chapter 178 Obtaining the loss function from angle resolved electron energy loss spectra
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    Chapter 179 Revisiting the determination of carbon sp2/sp3 ratios via analysis of the EELS carbon K-edge
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    Chapter 180 Orbital and spin sum rules for electron energy loss magnetic chiral dichroism: Application to metals and oxides
  182. Altmetric Badge
    Chapter 181 Probing bright and dark surface plasmon modes in individual and coupled Au nanoparticles using a fast electron beam
  183. Altmetric Badge
    Chapter 182 Dual energy range EELS spectrum imaging using a fast beam switch
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    Chapter 183 Determination of local composition of Li-Si alloys by Electron Energy-Loss Spectroscopy
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    Chapter 184 Elemental and bond mapping of complex nanostructures by MLS analysis of EELS spectrum-imaging data
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    Chapter 185 EELS analysis of plasmon resonance in the UV-vis energy range of metal alloy nanoparticles
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    Chapter 186 Anisotropic effects in ELNES of the O-K edge in rutile: a case of trichroism
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    Chapter 187 Dissimilar cation migration in (001) and (110) La2/3Ca1/3MnO3 thin films
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    Chapter 188 Energy-loss near edge structures of Cr2O3, CrO2 and YCrO4 phases
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    Chapter 189 Distortion corrections of ESI data cubes for magnetic studies
  191. Altmetric Badge
    Chapter 190 Optimisation of the Positions and the Width of the Energy Windows for the Recording of EFTEM Elemental Maps
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    Chapter 191 Band gap mapping using monochromated electrons
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    Chapter 192 StripeSTEM, a new method for the isochronous acquisition of HAADF images and monolayer resolved EELS
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    Chapter 193 Comparing Transmission Electron Microscopy (TEM) and Tomographic Atom Probe (TAP) through Measurements of Thin Multilayers
  195. Altmetric Badge
    Chapter 194 Development of a Process for Cleaning a TEM Column by Chemical Etching of Oxygen Radicals
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    Chapter 195 Low loss EELS study of gold nanoparticles using a monochromated TEM
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    Chapter 196 Analytical RPA response of Carbon and BN single-walled nanotubes: Application to EELS and wave loss spectra
  198. Altmetric Badge
    Chapter 197 Improvement of energy resolution of VEELS spectra with deconvolution method for electronic and optical properties analysis on ferroelectric oxides in nano-scale
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    Chapter 198 Low Loss Electron Energy Spectroscopy on LiFePO4 for Li ion Battery Applications
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    Chapter 199 Atomic-resolution studies of complex oxide materials using in-situ scanning transmission electron microscopy
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    Chapter 200 Low-loss EELS measurements on an oxide multilayer system using monochrome electrons
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    Chapter 201 White noise subtraction for calculating the two-particle-structure factor from inelastic diffractograms
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    Chapter 202 Local Analysis of BaTiO3/SrTiO3 interfaces by STEM-EELS
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    Chapter 203 Experimental conditions and data evaluation for quantitative EMCD measurements in the TEM
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    Chapter 204 Investigation of the valency distribution in Cu1.2Mn1.8O4 using quantitative EELS near-edge structures analysis
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    Chapter 205 EELS mapping of surface plasmons in star-shaped gold nanoparticles: morphological behaviour of optical properties from star to sphere
  207. Altmetric Badge
    Chapter 206 Fast local determination of phases in LixFePO4
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    Chapter 207 EELS/EFTEM in life science: proof of the presence of H2O2 in human skin by Ce deposition in melanosomes
  209. Altmetric Badge
    Chapter 208 Phase separation study of annealed SiOx films through energy filtered scanning transmission electron microscope
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    Chapter 209 Phase Identification of Aluminium Oxide Phases by Analysis of the Electron Energy-loss Near Edge Structure
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    Chapter 210 Valence sensitivity of Fe-L2,3 white-line ratios extracted from EELS
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    Chapter 211 Calculation of inelastic scattering events within second order QED — Implications of fully relativistic scattering
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    Chapter 212 Role of asymmetries for EMCD sum rules
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    Chapter 213 Smart acquisition EELS
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    Chapter 214 EELS fine structure tomography using spectrum imaging
  216. Altmetric Badge
    Chapter 215 Shift in electron energy loss compared for different nickel silicides in a Pt alloyed thin film
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    Chapter 216 Distribution of Fe and In dopants in ZnO: A combined EELS/EDS analysis
  218. Altmetric Badge
    Chapter 217 Changes in the Soot Microstructure during Combustion studied by SEM, TEM, Raman and EELS
  219. Altmetric Badge
    Chapter 218 EELS and EFTEM-investigations of aluminum alloy 6016 concerning the elements Al, Si and Mg
  220. Altmetric Badge
    Chapter 219 EELS modelling using a pseudopotential DFT code
  221. Altmetric Badge
    Chapter 220 The EELS spectrum database
  222. Altmetric Badge
    Chapter 221 STEM-EELS analysis of interface magnetic moments in Fe(100)/Co(bcc) superlattices
  223. Altmetric Badge
    Chapter 222 EMCD at high spatial resolution: comparison of STEM with EELS profiling
  224. Altmetric Badge
    Chapter 223 Elemental, Chemical and Physical State Mapping in Three-Dimensions using EELS-SI Tomography
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    Chapter 224 Sub-0.5 eV EFTEM Mapping using the Zeiss SESAM
  226. Altmetric Badge
    Chapter 225 Acquisition of the EELS data cube by tomographic spectroscopic imaging
  227. Altmetric Badge
    Chapter 226 A low electron fluence EELS study of Fe-coordination within ferrihydrite and phosphorous doped ferrihydrite nanoparticles
  228. Altmetric Badge
    Chapter 227 Optimal aperture sizes and positions for EMCD experiments
  229. Altmetric Badge
    Chapter 228 Chemical analysis of nickel silicides with high spatial resolution by combined EDS and EELS (ELNES)
  230. Altmetric Badge
    Chapter 229 Retrieving dielectric function by VEELS
  231. Altmetric Badge
    Chapter 230 Some Recent Materials Applications of In Situ High Resolution Electron Microscopy
  232. Altmetric Badge
    Chapter 231 Melting and solidification of alloys embedded in a matrix at nanoscale
  233. Altmetric Badge
    Chapter 232 Advances in transmission electron microscopy: in situ nanoindentation and in situ straining experiments
  234. Altmetric Badge
    Chapter 233 Observing Nanosecond Phenomena at the Nanoscale with the Dynamic Transmission Electron Microscope
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    Chapter 234 TEM characterization of nanostructures formed from SiGeO films: effect of electron beam irradiation
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    Chapter 235 In situ Lorentz microscopy in an alternating current magnetic field
  237. Altmetric Badge
    Chapter 236 In-situ transmission electron microscopy investigation of TiO islands nucleating on SrTiO3 (100) and (110) surfaces at high temperature
  238. Altmetric Badge
    Chapter 237 Probing integration strength of colloidal spheres self-assembled from TiO2 nanocrystals by in-situ TEM indentation
  239. Altmetric Badge
    Chapter 238 Installation and operation of an in situ electron microscopy facility
  240. Altmetric Badge
    Chapter 239 Bringing chemical reactions to life: environmental transmission electron microscopy (E-TEM)
  241. Altmetric Badge
    Chapter 240 Dynamic in situ experiments in a 1Å double aberration corrected environment
  242. Altmetric Badge
    Chapter 241 A very high temperature (2000°C) stage for atomic resolution in situ ETEM
  243. Altmetric Badge
    Chapter 242 Environmental High Resolution Electron Microscopy With a Closed Ecell: Application to Catalysts
  244. Altmetric Badge
    Chapter 243 Pulsed-mode photon and electron microscopy surveyed
  245. Altmetric Badge
    Chapter 244 In-situ Observation of Nano-particulate Gold Catalysts during Reaction by Closed-type Environmental-cell Transmission Electron Microscope
  246. Altmetric Badge
    Chapter 245 In situ transmission electron microscopy on leadzirconate-titanate under electrical field
  247. Altmetric Badge
    Chapter 246 Elongation of Atomic-size Wires: Atomistic Aspects and Quantum Conductance Studies
  248. Altmetric Badge
    Chapter 247 Atomic-size Silver Nanotube
  249. Altmetric Badge
    Chapter 248 In-situ TEM mechanical testing of a Si MEMS nanobridge
  250. Altmetric Badge
    Chapter 249 In-situ TEM nanoindentation and deformation of Si-nanoparticle clusters
  251. Altmetric Badge
    Chapter 251 Development of fast CCD Cameras for in-situ Electron Microscopy
  252. Altmetric Badge
    Chapter 252 In situ characterization of the mechanical properties of nanoparticles and nanoscale structures
  253. Altmetric Badge
    Chapter 253 In-situ engineering of nanostructures with near atomic precision and property measurements
  254. Altmetric Badge
    Chapter 255 In situ HRTEM — Image corrected and monochromated Titan equipped with environmental cell
  255. Altmetric Badge
    Chapter 362 Investigating the influence of dynamic scattering on ptychographical iterative techniques
  256. Altmetric Badge
    Chapter 379 EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
  257. Altmetric Badge
    Chapter 382 Quantitative study of anode microstructure related to SOFC stack degradation
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Title
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany : Volume 1: Instrumentation and Methods
Published by
Springer-Verlag Berlin Heidelberg, January 2008
DOI 10.1007/978-3-540-85156-1
ISBNs
978-3-54-085154-7, 978-3-54-085156-1
Authors

Luysberg, Martina, Tillmann, Karsten, Weirich, Thomas

Editors

Martina Luysberg, Karsten Tillmann, Thomas Weirich

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The data shown below were compiled from readership statistics for 156 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
United States 8 5%
Singapore 3 2%
Canada 3 2%
United Kingdom 2 1%
Sweden 2 1%
Japan 2 1%
Mexico 1 <1%
Egypt 1 <1%
India 1 <1%
Other 1 <1%
Unknown 132 85%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 59 38%
Researcher 34 22%
Student > Master 15 10%
Student > Bachelor 9 6%
Student > Doctoral Student 7 4%
Other 22 14%
Unknown 10 6%
Readers by discipline Count As %
Materials Science 49 31%
Physics and Astronomy 29 19%
Chemistry 22 14%
Engineering 17 11%
Agricultural and Biological Sciences 10 6%
Other 17 11%
Unknown 12 8%