EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany : Volume 1…
Springer-Verlag Berlin Heidelberg
Chapter title |
Off-axis electron holography and the FIB, a systematic study of the artefacts observed in semiconductor specimens
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Chapter number | 126 |
Book title |
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
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Published by |
Springer, Berlin, Heidelberg, January 2008
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DOI | 10.1007/978-3-540-85156-1_126 |
Book ISBNs |
978-3-54-085154-7, 978-3-54-085156-1
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Authors |
D. Cooper, C. Ailliot, R. Truche, J. Hartmann, J. Barnes, F. Bertin |
Country | Count | As % |
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Unknown | 1 | 100% |
Readers by professional status | Count | As % |
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Student > Master | 1 | 100% |
Readers by discipline | Count | As % |
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Materials Science | 1 | 100% |