Attention for Chapter 51:
Quantitative Investigations of the Depth of Field in a Corrected High Resolution Transmission Electron Microscope
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Chapter title |
Quantitative Investigations of the Depth of Field in a Corrected High Resolution Transmission Electron Microscope
|
Chapter number |
51 |
Book title |
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
|
Published by |
Springer, Berlin, Heidelberg, January 2008
|
DOI |
10.1007/978-3-540-85156-1_51 |
Book ISBNs |
978-3-54-085154-7, 978-3-54-085156-1
|
Authors |
J. Biskupek, A. Chuvilin, J. R. Jinschek, U. Kaiser
|
Mendeley readers
Mendeley readers
Geographical breakdown
Country |
Count |
As % |
Unknown |
3 |
100% |
Demographic breakdown
Readers by professional status |
Count |
As % |
Researcher |
2 |
67% |
Student > Master |
1 |
33% |
Readers by discipline |
Count |
As % |
Agricultural and Biological Sciences |
1 |
33% |
Physics and Astronomy |
1 |
33% |
Materials Science |
1 |
33% |