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Atomic Force Microscopy

Overview of attention for book
Cover of 'Atomic Force Microscopy'

Table of Contents

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    Book Overview
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    Chapter 1 Introduction
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    Chapter 2 Harmonic Oscillator
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    Chapter 3 Technical Aspects of Atomic Force Microscopy
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    Chapter 4 Atomic Force Microscopy Designs
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    Chapter 5 Electronics and Control for Atomic Force Microscopy
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    Chapter 6 Lock-in Technique
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    Chapter 7 Data Representation and Image Processing
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    Chapter 8 Artifacts in AFM
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    Chapter 9 Work Function, Contact Potential, and Kelvin Probe AFM
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    Chapter 10 Forces Between Tip and Sample
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    Chapter 11 Cantilevers and Detection Methods in Atomic Force Microscopy
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    Chapter 12 Static Atomic Force Microscopy
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    Chapter 13 Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy
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    Chapter 14 Intermittent Contact Mode/Tapping Mode
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    Chapter 15 Mapping of Mechanical Properties Using Force-Distance Curves
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    Chapter 16 Frequency Modulation (FM) Mode in Dynamic Atomic Force Microscopy—Non-contact Atomic Force Microscopy
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    Chapter 17 Noise in Atomic Force Microscopy
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    Chapter 18 Quartz Sensors in Atomic Force Microscopy
Attention for Chapter 9: Work Function, Contact Potential, and Kelvin Probe AFM
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