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Atomic Force Microscopy

Overview of attention for book
Attention for Chapter 8: Artifacts in AFM
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Citations

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Readers on

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116 Mendeley
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Chapter title
Artifacts in AFM
Chapter number 8
Book title
Atomic Force Microscopy
Published by
Springer, Cham, January 2019
DOI 10.1007/978-3-030-13654-3_8
Book ISBNs
978-3-03-013653-6, 978-3-03-013654-3
Authors

Bert Voigtländer

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 116 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
United Kingdom 1 <1%
Unknown 115 99%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 33 28%
Student > Bachelor 20 17%
Student > Master 12 10%
Researcher 10 9%
Student > Doctoral Student 7 6%
Other 9 8%
Unknown 25 22%
Readers by discipline Count As %
Materials Science 23 20%
Chemistry 19 16%
Engineering 15 13%
Physics and Astronomy 14 12%
Biochemistry, Genetics and Molecular Biology 7 6%
Other 10 9%
Unknown 28 24%