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Atomic Force Microscopy

Overview of attention for book
Attention for Chapter 17: Noise in Atomic Force Microscopy
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Citations

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Readers on

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7 Mendeley
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Chapter title
Noise in Atomic Force Microscopy
Chapter number 17
Book title
Atomic Force Microscopy
Published by
Springer, Cham, January 2019
DOI 10.1007/978-3-030-13654-3_17
Book ISBNs
978-3-03-013653-6, 978-3-03-013654-3
Authors

Bert Voigtländer

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 7 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 7 100%

Demographic breakdown

Readers by professional status Count As %
Researcher 3 43%
Student > Ph. D. Student 2 29%
Unknown 2 29%
Readers by discipline Count As %
Physics and Astronomy 3 43%
Materials Science 1 14%
Engineering 1 14%
Unknown 2 29%