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Mendeley readers
Chapter title |
Scanning Capacitance Microscopy for Electrical Characterization of Semiconductors and Dielectrics
|
---|---|
Chapter number | 4 |
Book title |
Scanning Probe Microscopy
|
Published by |
Springer, New York, NY, January 2007
|
DOI | 10.1007/978-0-387-28668-6_4 |
Book ISBNs |
978-0-387-28667-9, 978-0-387-28668-6
|
Authors |
J. J. Kopanski |
Mendeley readers
The data shown below were compiled from readership statistics for 16 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 16 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 6 | 38% |
Student > Doctoral Student | 2 | 13% |
Researcher | 2 | 13% |
Other | 1 | 6% |
Student > Bachelor | 1 | 6% |
Other | 3 | 19% |
Unknown | 1 | 6% |
Readers by discipline | Count | As % |
---|---|---|
Materials Science | 7 | 44% |
Engineering | 3 | 19% |
Physics and Astronomy | 3 | 19% |
Chemical Engineering | 1 | 6% |
Unknown | 2 | 13% |