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Scanning Probe Microscopy

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Cover of 'Scanning Probe Microscopy'

Table of Contents

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    Book Overview
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    Chapter 1 Introduction
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    Chapter 2 Scanning Tunneling Potentiometry: The Power of STM applied to Electrical Transport
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    Chapter 3 Probing Semiconductor Technology and Devices with Scanning Spreading Resistance Microscopy
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    Chapter 4 Scanning Capacitance Microscopy for Electrical Characterization of Semiconductors and Dielectrics
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    Chapter 5 Principles of Kelvin Probe Force Microscopy
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    Chapter 6 Frequency-Dependent Transport Imaging by Scanning Probe Microscopy
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    Chapter 7 Review of Ferroelectric Domain Imaging by Piezoresponse Force Microscopy
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    Chapter 8 Principles of Near-Field Microwave Microscopy
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    Chapter 9 Electromagnetic Singularities and Resonances in Near-Field Optical Probes
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    Chapter 10 Electrochemical SPM
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    Chapter 11 Near-Field High-Frequency Probing
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    Chapter 12 Scanning Probe Microscopy on Low-Dimensional Electron Systems in III–V Semiconductors
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    Chapter 13 Spin-Polarized Scanning Tunneling Microscopy
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    Chapter 14 Scanning Probe Measurements of Electron Transport in Molecules
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    Chapter 15 Scanning Probe Microscopy of Individual Carbon Nanotube Quantum Devices
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    Chapter 16 Conductance AFM Measurements of Transport Through Nanotubes and Nanotube Networks
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    Chapter 17 Theory of Scanning Probe Microscopy
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    Chapter 18 Multi-Probe Scanning Tunneling Microscopy
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    Chapter 19 Dynamic Force Microscopy and Spectroscopy in Vacuum
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    Chapter 20 Scanning Tunneling Microscopy and Spectroscopy of Manganites
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    Chapter 21 Scanning Voltage Microscopy
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    Chapter 22 Electrical Scanning Probe Microscopy of Biomolecules on Surfaces and at Interfaces
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    Chapter 23 Electromechanical Behavior in Biological Systems at the Nanoscale
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    Chapter 24 Scanning Capacitance Microscopy
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    Chapter 25 Kelvin Probe Force Microscopy of Semiconductors
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    Chapter 26 Nanoscale Characterization of Electronic and Electrical Properties of III-Nitrides by Scanning Probe Microscopy
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    Chapter 27 Electron Flow Through Molecular Structures
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    Chapter 28 Electrical Characterization of Perovskite Nanostructures by SPM
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    Chapter 29 SPM Measurements of Electric Properties of Organic Molecules
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    Chapter 30 High-Sensitivity Electric Force Microscopy of Organic Electronic Materials and Devices
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    Chapter 31 Electrical SPM-Based Nanofabrication Techniques
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    Chapter 32 Fundamental Science and Lithographic Applications of Scanning Probe Oxidation
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    Chapter 33 UHV-STM Nanofabrication on Silicon
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    Chapter 34 Ferroelectric Lithography
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    Chapter 35 Patterned Self-Assembled Monolayers via Scanning Probe Lithography
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    Chapter 36 Resistive Probe Storage: Read/Write Mechanism
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Mentioned by

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Citations

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Readers on

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107 Mendeley
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Title
Scanning Probe Microscopy
Published by
Springer New York, April 2007
DOI 10.1007/978-0-387-28668-6
ISBNs
978-0-387-28667-9, 978-0-387-28668-6
Editors

Kalinin, Sergei, Gruverman, Alexei

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 107 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Germany 2 2%
United Kingdom 1 <1%
Mexico 1 <1%
Belgium 1 <1%
Unknown 102 95%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 35 33%
Student > Master 16 15%
Student > Bachelor 12 11%
Researcher 8 7%
Student > Postgraduate 6 6%
Other 20 19%
Unknown 10 9%
Readers by discipline Count As %
Materials Science 24 22%
Engineering 18 17%
Physics and Astronomy 17 16%
Chemistry 17 16%
Unspecified 3 3%
Other 14 13%
Unknown 14 13%