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Mendeley readers
Chapter title |
Kelvin Probe Force Microscopy of Semiconductors
|
---|---|
Chapter number | 25 |
Book title |
Scanning Probe Microscopy
|
Published by |
Springer, New York, NY, January 2007
|
DOI | 10.1007/978-0-387-28668-6_25 |
Book ISBNs |
978-0-387-28667-9, 978-0-387-28668-6
|
Authors |
Y. Rosenwaks, S. Saraf, O. Tal, A. Schwarzman, Th. Glatzel, M. Ch. Lux-Steiner |
Mendeley readers
The data shown below were compiled from readership statistics for 35 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Germany | 2 | 6% |
United States | 1 | 3% |
Russia | 1 | 3% |
Switzerland | 1 | 3% |
Unknown | 30 | 86% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 17 | 49% |
Researcher | 7 | 20% |
Other | 2 | 6% |
Professor > Associate Professor | 2 | 6% |
Professor | 1 | 3% |
Other | 3 | 9% |
Unknown | 3 | 9% |
Readers by discipline | Count | As % |
---|---|---|
Materials Science | 12 | 34% |
Physics and Astronomy | 10 | 29% |
Engineering | 9 | 26% |
Earth and Planetary Sciences | 1 | 3% |
Unknown | 3 | 9% |