↓ Skip to main content

Design for Manufacturability and Yield for Nano-Scale CMOS

Overview of attention for book
Attention for Chapter 3: Systematic Yield - Lithography
Altmetric Badge

Citations

dimensions_citation
33 Dimensions
You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output. Click here to find out more.
Chapter title
Systematic Yield - Lithography
Chapter number 3
Book title
Design for Manufacturability and Yield for Nano-Scale CMOS
Published by
Springer, Dordrecht, January 2007
DOI 10.1007/978-1-4020-5188-3_3
Book ISBNs
978-1-4020-5187-6, 978-1-4020-5188-3
Authors

Charles C. Chiang, Jamil Kawa, Chiang, Charles C., Kawa, Jamil