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Design for Manufacturability and Yield for Nano-Scale CMOS

Overview of attention for book
Overall attention for this book and its chapters
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1 Wikipedia page

Citations

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33 Dimensions

Readers on

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20 Mendeley
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Title
Design for Manufacturability and Yield for Nano-Scale CMOS
Published by
Springer Netherlands, June 2007
DOI 10.1007/978-1-4020-5188-3
ISBNs
978-1-4020-5187-6, 978-1-4020-5188-3
Authors

Chiang, Charles C., Kawa, Jamil

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 20 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
China 1 5%
Saudi Arabia 1 5%
Brazil 1 5%
Unknown 17 85%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 6 30%
Student > Master 6 30%
Student > Doctoral Student 2 10%
Lecturer 1 5%
Professor 1 5%
Other 3 15%
Unknown 1 5%
Readers by discipline Count As %
Engineering 16 80%
Mathematics 1 5%
Materials Science 1 5%
Computer Science 1 5%
Unknown 1 5%