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| Chapter title |
Nonparametric Approach and Its Applications to Burn-in
|
|---|---|
| Chapter number | 9 |
| Book title |
Reliability, Yield, and Stress Burn-In
|
| Published by |
Springer, Boston, MA, January 1998
|
| DOI | 10.1007/978-1-4615-5671-8_9 |
| Book ISBNs |
978-0-7923-8107-5, 978-1-4615-5671-8
|
| Authors |
Way Kuo, Wei-Ting Kary Chien, Taeho Kim |