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X Demographics
Mendeley readers
| Chapter title |
Yield and Modeling Yield
|
|---|---|
| Chapter number | 4 |
| Book title |
Reliability, Yield, and Stress Burn-In
|
| Published by |
Springer, Boston, MA, January 1998
|
| DOI | 10.1007/978-1-4615-5671-8_4 |
| Book ISBNs |
978-0-7923-8107-5, 978-1-4615-5671-8
|
| Authors |
Way Kuo, Wei-Ting Kary Chien, Taeho Kim |
X Demographics
The data shown below were collected from the profile of 1 X user who shared this research output. Click here to find out more about how the information was compiled.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 1 | 100% |
Demographic breakdown
| Type | Count | As % |
|---|---|---|
| Members of the public | 1 | 100% |
Mendeley readers
The data shown below were compiled from readership statistics for 1 Mendeley reader of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 1 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Master | 1 | 100% |
| Readers by discipline | Count | As % |
|---|---|---|
| Chemical Engineering | 1 | 100% |