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Mendeley readers
Chapter title |
Negative Bias Temperature Instability in Nanoscale Devices
|
---|---|
Chapter number | 5 |
Book title |
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
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Published by |
Springer, Dordrecht, January 2014
|
DOI | 10.1007/978-94-007-7663-0_5 |
Book ISBNs |
978-9-40-077662-3, 978-9-40-077663-0
|
Authors |
Jacopo Franco, Ben Kaczer, Guido Groeseneken |
Mendeley readers
The data shown below were compiled from readership statistics for 2 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 2 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Master | 2 | 100% |
Readers by discipline | Count | As % |
---|---|---|
Engineering | 2 | 100% |