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| Chapter title |
Negative Bias Temperature Instability in (Si)Ge pMOSFETs
|
|---|---|
| Chapter number | 4 |
| Book title |
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
|
| Published by |
Springer, Dordrecht, January 2014
|
| DOI | 10.1007/978-94-007-7663-0_4 |
| Book ISBNs |
978-9-40-077662-3, 978-9-40-077663-0
|
| Authors |
Jacopo Franco, Ben Kaczer, Guido Groeseneken |