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Mendeley readers
| Chapter title |
Impact of Leakage Power and Variation on Testing
|
|---|---|
| Chapter number | 9 |
| Book title |
Leakage in Nanometer CMOS Technologies
|
| Published by |
Springer, Boston, MA, January 2006
|
| DOI | 10.1007/0-387-28133-9_9 |
| Book ISBNs |
978-0-387-25737-2, 978-0-387-28133-9
|
| Authors |
Ali Keshavarzi, Kaushik Roy |
Mendeley readers
The data shown below were compiled from readership statistics for 2 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| United States | 1 | 50% |
| Unknown | 1 | 50% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Researcher | 2 | 100% |
| Readers by discipline | Count | As % |
|---|---|---|
| Computer Science | 1 | 50% |
| Materials Science | 1 | 50% |