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Leakage in Nanometer CMOS Technologies

Overview of attention for book
Attention for Chapter 4: Methodologies for Power Gating
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Citations

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6 Mendeley
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Chapter title
Methodologies for Power Gating
Chapter number 4
Book title
Leakage in Nanometer CMOS Technologies
Published by
Springer, Boston, MA, January 2006
DOI 10.1007/0-387-28133-9_4
Book ISBNs
978-0-387-25737-2, 978-0-387-28133-9
Authors

Kimiyoshi Usami, Takayasu Sakurai

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 6 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
United States 1 17%
Unknown 5 83%

Demographic breakdown

Readers by professional status Count As %
Researcher 2 33%
Unspecified 1 17%
Student > Ph. D. Student 1 17%
Student > Master 1 17%
Unknown 1 17%
Readers by discipline Count As %
Engineering 2 33%
Unspecified 1 17%
Materials Science 1 17%
Computer Science 1 17%
Unknown 1 17%