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Chapter title |
An Electron Microprobe Analysis of Cu 2−x Layers Chemiplated on Single Crystals and Thin Films of CdS
|
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Chapter number | 75 |
Book title |
V th International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / V e Congrès International sur l’Optique des Rayons X et la Microanalyse
|
Published by |
Springer, Berlin, Heidelberg, January 1969
|
DOI | 10.1007/978-3-662-12108-5_75 |
Book ISBNs |
978-3-66-212110-8, 978-3-66-212108-5
|
Authors |
M. Fabbricotti, A. v. Aerschodt, J. J. Loferski, K. K. Reinhartz, A. P. v. Rosenstiel, A. P. Voskamp |