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Chapter title |
An Experimental Method for Determining the Depth Distribution of Characteristic X-Rays in Electron Microprobe Specimens
|
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Chapter number | 16 |
Book title |
V th International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / V e Congrès International sur l’Optique des Rayons X et la Microanalyse
|
Published by |
Springer, Berlin, Heidelberg, January 1969
|
DOI | 10.1007/978-3-662-12108-5_16 |
Book ISBNs |
978-3-66-212110-8, 978-3-66-212108-5
|
Authors |
U. Schmitz, P. L. Ryder, W. Pitsch |