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Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse : Tü…

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Cover of 'Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse : Tübingen, September 9th–14th, 1968'

Table of Contents

  1. Altmetric Badge
    Book Overview
  2. Altmetric Badge
    Chapter 1 Present State of X-Ray Interferometry
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    Chapter 2 X-Ray Reflection Optics (Recent Developments)
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    Chapter 3 The Figuring of an Aspherical X-Ray Lens
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    Chapter 4 Untersuchung zur ASR (Anomalous Surface Reflection) von Röntgenstrahlen mit einer Mikrofokus-Röntgenröhre
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    Chapter 5 Grazing Incidence X-Ray Telescopes
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    Chapter 6 Application of X-Ray Optical Methods in Solar Astronomy
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    Chapter 7 Detection of Weak X-Ray Sources by Image Integration
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    Chapter 8 Resolution Error Correction of Small Angle Scattering Data Using Hermite Functions
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    Chapter 9 Principles and Limitations of Electron Probe Microanalysis
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    Chapter 10 Recent Progress of Electron Microprobe in Japan
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    Chapter 11 Measurements of Backscattered Electron Energy Spectra for Primary Beam Energies of 10 to 30 keV
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    Chapter 12 Peak to Background Ratio in Microprobe Analysis
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    Chapter 13 A Study of the Deadtime Correction in Electron Probe Microanalysis
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    Chapter 14 The Measurement of Total Mass per Unit Area and Elemental Weight-Fractions along Line Scans in Thin Specimens
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    Chapter 15 A Method for Composition Determination of Alloy Thin Films
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    Chapter 16 An Experimental Method for Determining the Depth Distribution of Characteristic X-Rays in Electron Microprobe Specimens
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    Chapter 17 Etat actuel des méthodes quantitatives d’analyse par sonde électronique
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    Chapter 18 Présentation d’un programme de calcul sur ordinateur des diverses corrections à appliquer aux analyses à la microsonde électronique
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    Chapter 19 Programme de calcul de l‹intensité des rayons X émis en microanalyse à sonde électronique et analyse quantitative
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    Chapter 20 Formulae for Absorption Correction with Regard to Indirect Excitation of K , L and M Lines
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    Chapter 21 Accuracy of Atomic Number and Absorption Corrections in Electron Probe Microanalysis
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    Chapter 22 Propagation of Errors in Correction Models for Quantitative Electron Probe Microanalysis
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    Chapter 23 Prüfung der Korrekturen für Ordnungszahl, Absorption und sekundäre Fluoreszenz an metallischen Zweistofflegierungen mit nur je einem Matrixeffekt
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    Chapter 24 Eine empirische Methode zur quantitativen chemischen Analyse von Mikroteilchen mit der Mikrosonde
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    Chapter 25 The Magnitude of the “Continuous” Fluorescence Correction in Electronprobe Analysis
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    Chapter 26 An Attempt for Quantitative Procedure
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    Chapter 27 Analyse quantitative d’echantillons minces
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    Chapter 28 Phenomenes de fluorescence aux limites de phases
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    Chapter 29 Die Massenschwächungskoeffizienten der Kohlenstoff- K α -Linie in Abhängigkeit von der Ordnungszahl
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    Chapter 30 Messung des Massenabsorptionskoeffizienten in Kohlenstoff im Wellenbereich 10 bis 70 Å
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    Chapter 31 Recent Advances in Instrumentation for Microprobe Analysis
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    Chapter 32 A Precision Linear X-Ray Spectrometer
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    Chapter 33 Iron-Free Lenses for Electron Probe Forming Systems
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    Chapter 34 Elektronische Techniken für die Elektronenstrahl-Mikroanalyse
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    Chapter 35 Elektronenstrahl-Mikroanalyse mit der Elmisonde: Arbeitstechnik und Analysemöglichkeiten
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    Chapter 36 A Microanalysis Attachment for the Elmiskop I
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    Chapter 37 Performance Analysis of a Combined Electron Microscope and Electron Probe Microanalyser “EMMA”
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    Chapter 38 A Shielded X-Ray Microprobe for the Analysis of Radioactive Samples
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    Chapter 39 Analysis of Radioactive Materials by Means of an Electron Microprobe Demonstrated on UO<Subscript>2</Subscript>—Mo and UO<Subscript>2</Subscript>-Zircalloy Fuel Cermets
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    Chapter 40 The TPD Electron Probe X-Ray Micro Analyzer
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    Chapter 41 New Spectrometers and Accessories for the Electron Microprobe
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    Chapter 42 Geräte und Methoden zur quantitativen Gefügecharakterisierung mit der Mikrosonde
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    Chapter 43 Der Vielkanalanalysator als Zusatzgerät zur Mikrosonde für die Spurenanalyse und die Analyse mit geringen Strömen
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    Chapter 44 Développement d’accessoires adaptables au microanalyseur à sonde électronique pour l’étude des inclusions
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    Chapter 45 Sélecteur de fréquences X pour le rayonnement synchrotron. Etude de la réflexion spéculaire entre 6 et 14Å
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    Chapter 46 Microanalysis in the Transmission Electron Microscope by Selected Area Electron Spectrometry
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    Chapter 47 Microanalysis by Electron Energy Analysis with a Cylindrical Magnetic Lens
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    Chapter 48 Effect of Electron Source to Energy Resolution in Electron Velocity Analysis — Interpretation of Boersch Effect
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    Chapter 49 Microanalyseur par émission ionique secondaire
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    Chapter 50 Microanalysis with a Proton-Probe
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    Chapter 51 Microanalyse d’une surface solide par iono-luminescence
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    Chapter 52 A High Resolution Electron Microscope for Conventional Imaging and Scanning Mode of Operation
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    Chapter 53 Development of a Scanning Electron Mirror Microscope
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    Chapter 54 Computer Controlled Scanning Electron Microscope
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    Chapter 55 A New Scanning Electron Microscope
  57. Altmetric Badge
    Chapter 56 A Combined Scanning Electron Microscope/Electron Microprobe Analyzer
  58. Altmetric Badge
    Chapter 57 Photo Emission Electron Microscopy
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    Chapter 58 Röntgenemissionsspektrometrie von Elementen niedriger Ordnungszahl ( Z &lt; 15)
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    Chapter 59 The Detection of Light Elements
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    Chapter 60 Quantitative Analysis of Oxygen in Electron Probe Microanalysis
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    Chapter 61 Beryllium Determination in Electron Probe Microanalysis
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    Chapter 62 Microanalyse des éléments très légers
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    Chapter 63 Utilisation des compteurs à flux gazeux dans le domaine des rayons X ultra-mous pour l’étude des sources à émissions brèves
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    Chapter 64 The Accuracy of the Orientation of Cubic Crystals from Back Reflection Kossel Patterns
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    Chapter 65 Technique for Orientation Determinations by Means of Kossel Diffraction in the Electron Microprobe
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    Chapter 66 A Method for the Precise Determination of Lattice Spacings from Kossel Patterns from Selected Grains in Steel Samples
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    Chapter 67 A Variable Orientation Specimen Holder for Precision Microdiffraction in the Reflection Mode
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    Chapter 68 Hochtemperatur-Kossel-Technik
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    Chapter 69 Nouvelle méthode d’obtention des diagrammes de diffraction en rayonnement X divergent
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    Chapter 70 Metallurgical and Mineralogical Applications
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    Chapter 71 Mineralogical Applications of the Electron Probe Microanalyser
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    Chapter 72 Standards and Correction Procedures in Electron-Probe Analysis of Rock-Forming Minerals
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    Chapter 73 Specimen Damage during Microprobe Analysis of Silicate Glasses
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    Chapter 74 Investigation of Ni-Zn Ferrite Formation by Electron Probe Microanalyser
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    Chapter 75 An Electron Microprobe Analysis of Cu 2−x Layers Chemiplated on Single Crystals and Thin Films of CdS
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    Chapter 76 Application of X-Ray Microanalyser to Cast Iron “Relation between Few Elements of Nodular Graphite Cast Iron and Nodular Graphite”
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    Chapter 77 Absorberstrommessungen an Mehrphasensystemen
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    Chapter 78 Die Anwendung der Mikrosonde bei der Aufstellung von Mehrstoffsystemen
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    Chapter 79 Trace Elements in Ferro-Alloy Deoxidants and Their Influence on Non-Metallic Inclusion Compositions
  81. Altmetric Badge
    Chapter 80 Untersuchungen an supraleitenden Diffusionsschichten mit einer Elektronenstrahlmikrosonde
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    Chapter 81 Untersuchung von Diffusionsvorgängen an Mehrstoff-Gleitlagern mit der Elektronenstrahl-Mikrosonde
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    Chapter 82 The Influence of Surface Treatment on the Diffusivity in the Surface Layers of Stainless Steels
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    Chapter 83 Investigation of Hard Magnetic Materials by Small Angle Diffraction of Neutrons
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    Chapter 84 Mesure d’homogénéité des mélanges de poudres par micro-analyse a sonde électronique
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    Chapter 85 Analyse des précipités extraits sur repliques, à l’aide d’un microanalyseur classique et d’un microanalyseur équipé d’un microscope électronique
  87. Altmetric Badge
    Chapter 86 Diffusion chimique Zinc—Nickel. Coefficients de diffusion intrinsèques
  88. Altmetric Badge
    Chapter 87 Electron Probe Microanalysis of Ti(C, N) and Zr(C, N) in Steel
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    Chapter 88 Bestimmung der Grenzflächenenergie zwischen Zementit-Partikeln und Ferrit-Matrix mit Hilfe der Ostwald-Reifung
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    Chapter 89 Die Röntgenröhrenspannung als Einflußgröße bei der quantitativen RFA
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    Chapter 90 Messungen der Dichte dünner Aufdampfschichten
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    Chapter 91 Biological Work Using Microfluorescence Analysis
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    Chapter 92 Biological Applications of Projection X-Ray Microscopy
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    Chapter 93 Comparison between X-Ray Fluorescence and Ultra-Micro Flame Photometric Analyses of the Electrolyte Content in Single Cells
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    Chapter 94 X-Ray Histochemistry Used for Simultaneous Demonstration of Neurones and Capillaries in the Human Brain
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    Chapter 95 Histochimie par spectrographie des RX
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    Chapter 96 The Application of Microprobe Analysis to Biology
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    Chapter 97 Electron Microprobe Studies on the Mineralization Process of Tooth and Bone
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    Chapter 98 Electron Probe Microanalysis of Filled Human Teeth
  100. Altmetric Badge
    Chapter 99 Zerstörungsfreie Analyse von Zahnhartsubstanzen mit der Elektronenstrahlmikrosonde
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    Chapter 100 The Correlation of Bone Mineral with Body Build and Bone Turnover
  102. Altmetric Badge
    Chapter 101 The Correlation between Microradiography and Scanning Electron Microscopy of Bone Section Surfaces
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Title
Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse : Tübingen, September 9th–14th, 1968
Published by
Springer Science & Business Media, June 2013
DOI 10.1007/978-3-662-12108-5
ISBNs
978-3-66-212108-5, 978-3-66-212110-8
Editors

Möllenstedt, G., Gaukler, K. H.

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