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Materials Fundamentals of Gate Dielectrics

Overview of attention for book
Attention for Chapter 12: Methodology for Development of High-κ Stacked Gate Dielectrics on III–V Semiconductors
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Chapter title
Methodology for Development of High-κ Stacked Gate Dielectrics on III–V Semiconductors
Chapter number 12
Book title
Materials Fundamentals of Gate Dielectrics
Published by
Springer, Dordrecht, January 2005
DOI 10.1007/1-4020-3078-9_12
Book ISBNs
978-1-4020-3077-2, 978-1-4020-3078-9
Authors

Matthias Passlack, Passlack, Matthias

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 15 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 15 100%

Demographic breakdown

Readers by professional status Count As %
Researcher 5 33%
Professor 2 13%
Student > Doctoral Student 2 13%
Student > Master 2 13%
Student > Ph. D. Student 2 13%
Other 0 0%
Unknown 2 13%
Readers by discipline Count As %
Engineering 6 40%
Materials Science 5 33%
Physics and Astronomy 3 20%
Unknown 1 7%