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Scanning Transmission Electron Microscopy : Imaging and Analysis

Overview of attention for book
Cover of 'Scanning Transmission Electron Microscopy : Imaging and Analysis'

Table of Contents

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    Book Overview
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    Chapter 1 A Scan Through the History of STEM
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    Chapter 2 The Principles of STEM Imaging
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    Chapter 3 The Electron Ronchigram
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    Chapter 4 Spatially Resolved EELS: The Spectrum-Imaging Technique and Its Applications
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    Chapter 5 Energy Loss Near-Edge Structures
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    Chapter 6 Simulation and Interpretation of Images
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    Chapter 7 X-Ray Energy-Dispersive Spectrometry in Scanning Transmission Electron Microscopes
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    Chapter 8 STEM Tomography
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    Chapter 9 Scanning Electron Nanodiffraction and Diffraction Imaging
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    Chapter 10 Applications of Aberration-Corrected Scanning Transmission Electron Microscopy and Electron Energy Loss Spectroscopy to Complex Oxide Materials
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    Chapter 11 Application to Ceramic Interfaces
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    Chapter 12 Application to Semiconductors
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    Chapter 13 Nanocharacterization of Heterogeneous Catalysts by Ex Situ and In Situ STEM
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    Chapter 14 Structure of Quasicrystals
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    Chapter 15 Atomic-Resolution STEM at Low Primary Energies
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    Chapter 16 Low-Loss EELS in the STEM
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    Chapter 17 Variable Temperature Electron Energy-Loss Spectroscopy
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    Chapter 18 Fluctuation Microscopy in the STEM
Attention for Chapter 10: Applications of Aberration-Corrected Scanning Transmission Electron Microscopy and Electron Energy Loss Spectroscopy to Complex Oxide Materials
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