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Scanning Transmission Electron Microscopy : Imaging and Analysis

Overview of attention for book
Attention for Chapter 16: Low-Loss EELS in the STEM
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Citations

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24 Mendeley
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Chapter title
Low-Loss EELS in the STEM
Chapter number 16
Book title
Scanning Transmission Electron Microscopy
Published by
Springer, New York, NY, January 2011
DOI 10.1007/978-1-4419-7200-2_16
Book ISBNs
978-1-4419-7199-9, 978-1-4419-7200-2
Authors

Nigel D. Browning, Ilke Arslan, Rolf Erni, Bryan W. Reed

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 24 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
United States 1 4%
Unknown 23 96%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 10 42%
Researcher 6 25%
Student > Doctoral Student 3 13%
Student > Master 2 8%
Unknown 3 13%
Readers by discipline Count As %
Materials Science 10 42%
Physics and Astronomy 4 17%
Engineering 3 13%
Chemistry 1 4%
Medicine and Dentistry 1 4%
Other 0 0%
Unknown 5 21%