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Mendeley readers
| Chapter title |
Application to Semiconductors
|
|---|---|
| Chapter number | 12 |
| Book title |
Scanning Transmission Electron Microscopy
|
| Published by |
Springer, New York, NY, January 2011
|
| DOI | 10.1007/978-1-4419-7200-2_12 |
| Book ISBNs |
978-1-4419-7199-9, 978-1-4419-7200-2
|
| Authors |
James M. LeBeau, Dmitri O. Klenov, Susanne Stemmer |
Mendeley readers
The data shown below were compiled from readership statistics for 15 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| United States | 1 | 7% |
| Unknown | 14 | 93% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Ph. D. Student | 7 | 47% |
| Researcher | 3 | 20% |
| Unspecified | 1 | 7% |
| Student > Doctoral Student | 1 | 7% |
| Student > Master | 1 | 7% |
| Other | 0 | 0% |
| Unknown | 2 | 13% |
| Readers by discipline | Count | As % |
|---|---|---|
| Materials Science | 4 | 27% |
| Physics and Astronomy | 4 | 27% |
| Unspecified | 1 | 7% |
| Medicine and Dentistry | 1 | 7% |
| Engineering | 1 | 7% |
| Other | 0 | 0% |
| Unknown | 4 | 27% |