Chapter 1 A Scan Through the History of STEM

Chapter 2 The Principles of STEM Imaging

Chapter 4 Spatially Resolved EELS: The Spectrum-Imaging Technique and Its Applications

Chapter 5 Energy Loss Near-Edge Structures

Chapter 6 Simulation and Interpretation of Images

Chapter 7 X-Ray Energy-Dispersive Spectrometry in Scanning Transmission Electron Microscopes

Chapter 8 STEM Tomography

Chapter 9 Scanning Electron Nanodiffraction and Diffraction Imaging

Chapter 10 Applications of Aberration-Corrected Scanning Transmission Electron Microscopy and Electron Energy Loss Spectroscopy to Complex Oxide Materials

Chapter 11 Application to Ceramic Interfaces

Chapter 12 Application to Semiconductors

Chapter 13 Nanocharacterization of Heterogeneous Catalysts by Ex Situ and In Situ STEM

Chapter 14 Structure of Quasicrystals

Chapter 15 Atomic-Resolution STEM at Low Primary Energies

Chapter 16 Low-Loss EELS in the STEM

Chapter 17 Variable Temperature Electron Energy-Loss Spectroscopy

Chapter 18 Fluctuation Microscopy in the STEM