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Reliability of Organic Compounds in Microelectronics and Optoelectronics

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Cover of 'Reliability of Organic Compounds in Microelectronics and Optoelectronics'

Table of Contents

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    Book Overview
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    Chapter 1 Degradation Mechanisms of Silicones
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    Chapter 2 Degradation Mechanisms of Aromatic Polycarbonate
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    Chapter 3 EMC Oxidation Under High-Temperature Aging
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    Chapter 4 Peridynamic Modeling of Thermo-oxidative Degradation in Polymers
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    Chapter 5 Molecular Modeling for Reliability Issues
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    Chapter 6 Health Monitoring, Machine Learning, and Digital Twin for LED Degradation Analysis
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    Chapter 7 Reliability and Failures in Solid State Lighting Systems
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    Chapter 8 Degradation and Failures of Polymers Used in Light-Emitting Diodes
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    Chapter 9 Degradation and Reliability of Organic Materials in Organic Light-Emitting Diodes (OLEDs)
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    Chapter 10 Artificial Intelligence and LED Degradation
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    Chapter 11 Degradation Analysis for Reliability of Optoelectronics
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    Chapter 12 Reliability and Failure of Microelectronic Materials
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    Chapter 13 Degradation and Remaining Useful Life Prediction of Automotive Electronics
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    Chapter 14 Reliability and Degradation of Power Electronic Materials
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    Chapter 15 Degradation of Cure-Induced Stress Levels in Micro-electronics
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    Chapter 16 Manufacturing for Reliability of Panel-Level Fan-out Packages
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    Chapter 17 Outlook: From Physics of Failure to Physics of Degradation
Attention for Chapter 5: Molecular Modeling for Reliability Issues
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Chapter title
Molecular Modeling for Reliability Issues
Chapter number 5
Book title
Reliability of Organic Compounds in Microelectronics and Optoelectronics
Published by
Springer, Cham, January 2022
DOI 10.1007/978-3-030-81576-9_5
Book ISBNs
978-3-03-081575-2, 978-3-03-081576-9
Authors

Iwamoto, Nancy E.