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Chapter title |
Degradation Analysis for Reliability of Optoelectronics
|
---|---|
Chapter number | 11 |
Book title |
Reliability of Organic Compounds in Microelectronics and Optoelectronics
|
Published by |
Springer, Cham, January 2022
|
DOI | 10.1007/978-3-030-81576-9_11 |
Book ISBNs |
978-3-03-081575-2, 978-3-03-081576-9
|
Authors |
Qian, Cheng, Wu, Zeyu, Chen, Wei, Fan, Jiajie, Yang, Xi, Ren, Yi, Sun, Bo, Wang, Zili |