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Chapter title |
Fatigue Life Assessment of Rail Transit Electronics Based on Physics of Failure
|
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Chapter number | 71 |
Book title |
Proceedings of the 4th International Conference on Electrical and Information Technologies for Rail Transportation (EITRT) 2019
|
Published by |
Springer, Singapore, October 2019
|
DOI | 10.1007/978-981-15-2866-8_71 |
Book ISBNs |
978-9-81-152865-1, 978-9-81-152866-8
|
Authors |
Jing Long, Sheng yun Xu, Zhipeng Wang, Xiao qing Cheng, Long, Jing, Xu, Sheng yun, Wang, Zhipeng, Cheng, Xiao qing |