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Chapter title |
MEMS Reliability for Space Applications by Elimination of Potential Failure Modes through Analysis
|
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Chapter number | 25 |
Book title |
MEMS and Nanotechnology, Volume 4
|
Published by |
Springer, New York, NY, January 2011
|
DOI | 10.1007/978-1-4614-0210-7_25 |
Book ISBNs |
978-1-4614-0209-1, 978-1-4614-0210-7
|
Authors |
Rohit Soni, Soni, Rohit |