Efficient protection of polar decoders against Single Event Upsets (SEUs) on user memories
Article in Microelectronics Reliability (October 2023)
The most recent citing publications are shown below. View all 43 publications that cite this research output on Dimensions.
Article in Microelectronics Reliability (October 2023)
Article in IEEE Transactions on Device and Materials Reliability (January 2023)
Article in IEEE Transactions on Computers (June 2022)