You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output.
Click here to find out more.
| Chapter title |
Challenges in the Future
|
|---|---|
| Chapter number | 6 |
| Book title |
Dependability in Electronic Systems
|
| Published by |
Springer, New York, NY, January 2011
|
| DOI | 10.1007/978-1-4419-6715-2_6 |
| Book ISBNs |
978-1-4419-6714-5, 978-1-4419-6715-2
|
| Authors |
Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu, Kanekawa, Nobuyasu, Ibe, Eishi H., Suga, Takashi, Uematsu, Yutaka |