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Chapter title |
Thermal Wave Imaging of Nonvisible Defects in IC Devices
|
---|---|
Chapter number | 138 |
Book title |
Review of Progress in Quantitative Nondestructive Evaluation
|
Published by |
Springer, Boston, MA, January 1990
|
DOI | 10.1007/978-1-4684-5772-8_138 |
Book ISBNs |
978-1-4684-5774-2, 978-1-4684-5772-8
|
Authors |
W. Lee Smith, C. G. Welles, Allan Rosencwaig, Smith, W. Lee, Welles, C. G., Rosencwaig, Allan |