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Chapter title |
Testability Analysis of Circuits using Data-Dependent Power Management
|
---|---|
Chapter number | 29 |
Book title |
VLSI: Integrated Systems on Silicon
|
Published by |
Springer, Boston, MA, January 1997
|
DOI | 10.1007/978-0-387-35311-1_29 |
Book ISBNs |
978-1-4757-6949-4, 978-0-387-35311-1
|
Authors |
José C. Monteiro, João P. Marques Silva, Monteiro, José C., Silva, João P. Marques |